MIL-I-46576A(OS)
4.2.2 Examination. One hundred percent examination shall be performed for all critical defects. Examination for major and minor defects shall be performed in accordance with the classification of defects. Four power (4x) magnification may be used for inspection of such defects as burr and foreign matter. When compliance with the applicable requirement is in doubt as a result of visual examination, the characteristic shall be measured or gaged to determine acceptability. All nonconforming material shall be rejected.
4.2.2.1 Cartridge, Drawing 8594157, covering a detail of Drawing 8596170.
Characteristics Critical |
Defect |
Method of Inspection |
1 |
Mixed cartridges |
Visual |
2 |
Metal defective |
Visual |
Major 101 |
Foreign matter present |
Visual |
Minor 201 |
Case scratched, wrinkled, bulged, or dented |
Visual |
202 |
Varnish missing or inadequate |
Visual |
4.2.2.2 Assembly, Drawing 8596170, less all drawings except Drawings 8593012, 8594744, 8594745, MS28775-009 and MS28775-214.
Critical 1 |
Firing pin protrusion |
Gage |
2 |
Shear pin not engaged in firing pin |
Visual |
3 |
Shear pin setscrew missing |
Visual |
Major 101 |
O-ring not lubricated |
Visual |
102 |
Burr |
Visual |
103 |
Foreign matter |
Visual |
Minor None defined |
4.2.2.3 Assembly, Drawing 8596170, less all drawings except Drawings 8593012, 8593013, 8594744,
8594745, MS28775-009, and MS28775-214.
Critical |
||
1 |
Cartridge loose or missing |
Visual/Manual |
2 |
Cartridge retainer loose |
Visual/Manual |
3 |
Metering groove of cartridge retainer missing |
Visual |
4 Major |
Elongated hole of cartridge retainer missing |
Visual |
5
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