MIL-DTL-50648B
anvil or other misplaced or deformed inert parts; anvil abnormally close to the ignition device cup dome;
and all other observable defects in assembly.
4.7.2 Protective finish. Unless otherwise specified (see 6.2), sampling plans and procedures in the
determination of acceptability of coated parts submitted by the contractor shall be in accordance with the
contract and MIL-A-8625. The anodized part shall be sectioned longitudinally to better expose the
critical surfaces to salt spray test.
4.7.3 Delay element x-ray. Prior to assembly into a cartridge, the delay element shall be
radiographically examined in accordance with ASTM E1742. Each delay element shall be x-rayed with
the sides of the delay element perpendicular to the rays. The x-ray negatives shall be identified by item
nomenclature and by lot number. Delay elements are to be left mounted to the boards or trays until after
the x-rays have been reviewed and defects identified to facilitate removal of defective units. After
screening, the x-ray negatives with defectives identified shall be forwarded to the engineering activity
designated by the procuring activity.
4.7.4 Vibration test. Twelve of the 21 assembled delay elements of the first article sample, x-rayed as
directed in 4.7.3 and properly identified, shall be subjected to a vibration test. The method and
procedures for performing the vibration test shall be in accordance with MIL-STD-810, Method 514.3,
Test Procedure I, Test Condition I-3.2.5 (see 6.2). Then the 12 vibrated delay elements shall be x-rayed
again. Evidence of any disintegration of the ignition device, propellant, or derangement of any
component shall be cause for rejection of the sample. When there is a change in the method of charging
the delay element or in the lot of ignition devices, twelve additional delay elements shall be selected and
tested as indicated herein.
4.7.5 Functional. The following tests shall be performed by the Government.
4.7.5.1 Ballistics.
4.7.5.1.1 First article. Twenty one assembled delay elements of the first article sample shall be grouped
and temperature conditioned as described in table III and 4.8. Following removal from the conditioning
chamber, the delay element shall be tested as required by 3.6.1.2. Failure of delay element to comply
with 3.6.1.2 shall be cause for sample rejection.
4.7.5.1.2 Production lot acceptance. Twenty one assembled delay elements from each production lot
shall be grouped and temperature conditioned in accordance with 3.6.1.2. Failure of a delay element to
comply with 3.6.1.2 shall be cause for rejection of the lot. In addition to the sample of delay elements for
the above test, 10 additional delay elements shall be furnished from each production lot for investigative
purposes.
4.7.5.2 Retest. There shall be no retests.
4.7.5.2.1 Test failure. If a test failure is attributable to an assignable cause, excluding the test cartridge,
the original test results shall be discarded and that test reconducted.
4.8 Temperature conditioning. The conditioning chamber shall be preconditioned to the specified
temperature. Once the temperature inside the chamber has stabilized, the samples shall be placed inside
and maintained at the specified temperature for 4 hours minimum, 24 hours maximum.
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