MIL-D-46606B
number. Delay elements are to be left mounted to the boards or trays until after the x-rays have been reviewed
and defects identified to facilitate removal of defective units. After screening, the x-ray negatives with
defectives identified shall be forwarded to the engineering activity designated by the procuring activity.
4.7.4 Vibration test. Twelve of the 21 assembled delay elements of the first article sample, x-rayed as
directed in 4.7.3 and properly identified, shall be subjected to a vibration test. The method and procedures
for performing the vibration test shall be in accordance with MIL-STD-810, Method 514.3, Test Procedure
I, Test Condition I-3.2.5 (see 6.2). Then the 12 vibrated delay elements shall be x-rayed again. Evidence of
any disintegration of the primer, propellant, or derangement of any component shall be cause for rejection of
the sample. When there is a change in the method of charging the delay element or in the lot of primers,
twelve additional delay elements shall be selected and tested as indicated herein.
4.7.5 Functional. The following tests shall be performed by the Government.
4.7.5.1 Ballistics.
4.7.5.1.1 First article. Twenty one assembled delay elements of the first article sample shall be grouped
and temperature conditioned as described in table III and 4.8. Following removal from the conditioning
chamber, the delay element shall be tested as required by 3.6.1.2. Failure of delay element to comply with
3.6.1.2 shall be cause for sample rejection.
4.7.5.1.2 Production lot acceptance. Twenty one assembled delay elements from each production lot
shall be grouped and temperature conditioned in accordance with 3.6.1.2. Failure of a delay element to
comply with 3.6.1.2 shall be cause for rejection of the lot. In addition to the sample of delay elements for the
above test, 10 additional delay elements shall be furnished from each production lot for investigative purposes.
4.7.5.2 Retest. There shall be no retests.
4.7.5.2.1 Test failure. If a test failure is attributable to an assignable cause, excluding the test cartridge,
the original test results shall be discarded and that test reconducted.
4.8 Temperature conditioning. The conditioning chamber shall be preconditioned to the specified
temperature. Once the temperature inside the chamber has stabilized, the samples shall be placed inside and
maintained at the specified temperature for 4 hours minimum, 24 hours maximum.
4.8.1 Reconditioning. The sample must be tested within five minutes after removal from the
conditioning chamber. If this time is exceeded, the cartridge shall be reconditioned in accordance with 4.8.
4.9 Inspection of packaging. The sampling and inspection of the preservation, packing, and container
marking shall be in accordance with the requirements of section 5.
5. PACKAGING
5.1 Packing and marking. Packing and marking shall be in accordance with Drawings 8826728 and
8826729, except that the marking shall refer to delay element, cartridge, M8 assembly.
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