MIL-DTL-60567C
the x rays have been reviewed and defects identified to facilitate removal of defective units. After
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screening, the x-ray negatives with defectives identified, shall be forwarded to the engineering activity
designated by the acquiring activity (see 6.2). Interpretation of the radiographic films shall verify the
following: missing or abnormally thin charge; charge broken, cracked or porous; cracked or off-center
anvil or other misplaced or deformed inert parts; anvil abnormally close to the ignition device cup dome;
and all other observable defects in assembly.
4.7.2 Protective finish. Unless otherwise specified (see 6.2), sampling plans and procedures in the
determination of acceptability of coated parts submitted by the contractor shall be in accordance with the
contract and MIL-A-8625. The anodized part shall be sectioned longitudinally to better expose the critical
surfaces to salt spray test.
4.7.3 Delay ele ment x-ray. Prior to assembly into a cartridge, the delay element shall be radiographically
examined in accordance with ASTM E1742. Each delay element shall be x-rayed with the sides of the
delay element perpendicular to the rays. The x-ray negatives shall be identified by item nomenclature and
by lot number. Delay elements are to be left mounted to the boards or trays until after the x-rays have
been reviewed and defects identified to facilitate removal of defective units. After screening, the x ray
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negatives with defectives identified, shall be forwarded to the engineering activity designated by the
acquiring activity.
4.7.4 Vibration test. Twelve of the 30 assembled delay elements of the first article sample, x rayed as
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directed in 4.7.4, properly identified, shall be subjected to vibration. The method and procedures for
performing the vibration test shall be in accordance with MIL-STD-810 Method 514.3, Test Procedure I,
Test Condition 1-3.2.5 (see 6.2). Then the 12 vibrated delay elements shall be x-rayed again. Evidence of
any disintegration of the ignition device, propellant, or derangement of any component shall be cause for
rejection of the sample. When there is a change in the method of charging the delay element or in the lot
of ignition devices, twelve additional delay elements shall be selected and tested as indicated herein.
4.7.5 Functional. The following tests shall be performed by the Government.
4.7.5.1 Ballistics
4.7.5.1.1 First article. Thirty assembled delay elements of the first articl sample shall be grouped and
e
temperature conditioned as described in table III and 4.8. Following removal from the conditioning
chamber, the delay element shall be tested as required by 3.6.1.2. Failure of delay element to comply with
3.6.1.2 shall be cause for sample rejection.
4.7.5.1.2 Production lot acceptance. Thirty assembled delay elements from each production lot shall be
grouped and temperature conditioned in accordance with 3.6.1.2. Failure of a delay element to comply
with 3.6.1.2 shall be cause for rejection of the lot. In addition to the sample of delay elements for the
above test, 10 additional delay elements shall be furnished from each production lot for investigative
purposes.
4.7.5.2 Retest. There shall be no retests.
4.7.5.2.1 Test failure. If a test failure is attributable to an assignable cause, excluding the test cartridge,
the original test results shall be discarded and that test reconducted.
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